Cart (Loading....) | Create Account
Close category search window
 

One time transient failure investigation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mallette, L.A. ; Hughes Aircraft Co., Los Angeles, CA, USA ; Varney, J.

A 0.5 dB degradation of a flight model frequency generator was observed for three minutes. The zero risk environment led to Herculean efforts to resolve this problem. An extensive test program did not find the problem so a detailed visual inspection was performed and a dendrite was found at the lowest level of assembly. That module was replaced, and a paper search of the build process was initiated to determine if the problem was generic to the other units that had been produced

Published in:

Aerospace Applications Conference, 1994. Proceedings., 1994 IEEE

Date of Conference:

5-12 Feb 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.