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Design and on-wafer testing of millimeter-wave external optical modulators

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3 Author(s)
Polifko, D. ; ATR Opt. & Radio Commun. Res. Labs., Kyoto, Japan ; Matsui, K. ; Ogawa, H.

Highly accurate computation of the microwave refractive index and impedance of coplanar waveguides on Ti:LiNbO/sub 3/, Mach-Zehnder external optical modulators is performed using the extended spectral domain approach. Narrowband millimeter-wave modulators based on these calculations have been designed, fabricated, and tested with an on-wafer, 0-40-GHz, optical and electrical probe station.<>

Published in:

Microwave Symposium Digest, 1993., IEEE MTT-S International

Date of Conference:

14-18 June 1993

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