Referenced Items are not available for this document.
Photoconductive switches fabricated by compatible microwave device processing techniques were used for on-wafer characterization of a long high-frequency interconnect exceeding a 160-GHz measurement bandwidth. The origin of the unwanted resistive tail of coplanar strip lines is investigated. The interconnect coplanar strips are characterized in terms of the attenuation and phase constants up to 160 GHz. It is noted that full characterization of this interconnect structure is important for determining the cycle time of future high-speed computers.<
Published in:
Microwave Symposium Digest, 1993., IEEE MTT-S International
Date of Conference: 14-18 June 1993
- Page(s):
- 1395 - 1398 vol.3
- Meeting Date :
- 14 Jun 1993-18 Jun 1993
- ISSN :
- 0149-645X
- Print ISBN:
- 0-7803-1209-0
- INSPEC Accession Number:
- 4534270
- Conference Location :
- Atlanta, GA, USA
- Digital Object Identifier :
- 10.1109/MWSYM.1993.276737
- Product Type:
- Conference Publications
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