By Topic

Modified Duc de Chaulnes' method for measurement of mode indexes of semiconductor slab waveguides

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ura, S. ; Dept. of Electron. Eng., Osaka Univ., Japan ; Suhara, T. ; Nishihara, H.

For measuring mode indexes of AlGaAs waveguides, a modified Duc de Chaulnes method, which is noncontact, nondestructive, and applicable to high index as well as buried waveguide, is proposed and discussed. Mode indexes are measured by reference to the substrate index by comparing waveguide and substrate in the displacement of image. Measurement accuracy is improved in comparison with the conventional Duc de Chaulnes method. From experimental work on the identification accuracy of the imaging objective position, it was confirmed that the error in the mode index was smaller than 0.2%.<>

Published in:

Photonics Technology Letters, IEEE  (Volume:5 ,  Issue: 12 )