By Topic

Yield and productivity management

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Effron, M.S. ; IBM Corp., Essex Junction, VT, USA

Summary form only given. The approaches, attitudes, and methodologies used by over 20 semiconductor manufacturers to manage yield and improve productivity have been examined. Selected topics in management systems and measurements, long- and short-loop analysis, data and information generation and handling, and manufacturing operational procedures have been considered

Published in:

Advanced Semiconductor Manufacturing Conference and Workshop, 1992. ASMC 92 Proceedings. IEEE/SEMI 1992

Date of Conference:

30 Sep-1 Oct 1992