Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Selecting the most reliable design under type-II censored accelerated testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chang, D.-S. ; Dept. of Bus. Adm., Nat. Central Univ., Chung-Li, Taiwan ; Huang, D.-Y. ; Tseng, S.-T.

Accelerated life tests (ALTs) of products and materials are used to obtain reliability information within a reasonable time frame. However, there are no suitable selection rules for selecting the best product or material as a result of the ALT. Under the type-II censoring plan, a reasonable selection rule for an ALT using the Arrhenius model is proposed. The advantages of this selection rule are compared with a nonALT selection rule by using as criteria the average ratio of time-saving in life testing and sample size. The tradeoff between an increased sample size and a shortened life testing time for the ALT selection procedure is feasible

Published in:

Reliability, IEEE Transactions on  (Volume:41 ,  Issue: 4 )