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A new pseudo-exhaustive test method

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3 Author(s)
Jhing-Fa Wang ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Wei-Lun Wang ; Tzyy-Kuen Tien

An efficient and systematic pseudo-exhaustive test pattern generation algorithm has been proposed in this paper to solve the problem of test generation in BIST. The algorithm has the following advantages: (1) it requires a minimum number of test signals for testing a circuit (2) it executes quickly with polynomial time complexity (3) it requires fewer test patterns and low hardware cost compared to five previous proposed methods

Published in:

VLSI Technology, Systems, and Applications, 1991. Proceedings of Technical Papers, 1991 International Symposium on

Date of Conference:

22-24 May 1991