Cart (Loading....) | Create Account
Close category search window
 

A consideration on generalized Rician distribution expression for the speckle pattern on the ultrasound B-scan and its experimental confirmation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Miyata, S. ; Fac. of Eng., Kinki Univ., Hiroshima, Japan ; Ohta, M.

Analysis of speckle image texture in ultrasound B-scans is considered. The authors examine the theoretical determination of the probability density function of the speckle image texture for the magnitude. First, the occurrence mechanism of speckle image texture is treated by introducing a functional model for the ultrasound diagnosis equipment system. As a result, a unified probability density function expression has been explicitly proposed and it has been clarified that the present expression agrees with the well-known Rayleigh and Rician probability density functions as two special cases. Then the legitimacy and the effectiveness of proposed stochastic analysis method have been experimentally confirmed by applying it to the speckle pattern of a clinical B-scan image actually utilized for diagnostic purposes

Published in:

Industrial Electronics, Control and Instrumentation, 1991. Proceedings. IECON '91., 1991 International Conference on

Date of Conference:

28 Oct-1 Nov 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.