Referenced Items are not available for this document.
The authors describe a life-cycle approach for testing expert systems. They comment on the difficulties associated with testing of an expert system. Pragmatic testing methods of conventional software engineering are proposed as a solution to these problems. The application of these techniques is illustrated through an extended example for the expert system, MAPS, which diagnoses faults in a bipolar transistor induced to process defects in a VLSI manufacturing environment
Published in:
Computer Software and Applications Conference, 1992. COMPSAC '92. Proceedings., Sixteenth Annual International
Date of Conference: 21-25 Sep 1992
- Page(s):
- 320 - 325
- Meeting Date :
- 21 Sep 1992-25 Sep 1992
- Print ISBN:
- 0-8186-3000-0
- INSPEC Accession Number:
- 4382863
- Conference Location :
- Chicago, IL
- Digital Object Identifier :
- 10.1109/CMPSAC.1992.217584
- Product Type:
- Conference Publications
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