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Testing expert systems using conventional techniques

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3 Author(s)
Tsai, W.T. ; Minnesota Univ., Minneapolis, MN, USA ; Kirani, S. ; Zualkernan, I.A.

The authors describe a life-cycle approach for testing expert systems. They comment on the difficulties associated with testing of an expert system. Pragmatic testing methods of conventional software engineering are proposed as a solution to these problems. The application of these techniques is illustrated through an extended example for the expert system, MAPS, which diagnoses faults in a bipolar transistor induced to process defects in a VLSI manufacturing environment

Published in:

Computer Software and Applications Conference, 1992. COMPSAC '92. Proceedings., Sixteenth Annual International

Date of Conference:

21-25 Sep 1992