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An incomplete scan design approach to test generation for sequential machines

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4 Author(s)
H. -K. T. Ma ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; S. Devadas ; A. R. Newton ; A. Sangiovanni-Vincentelli

An incomplete scan design approach to sequential test generation is presented. This approach represents a significant departure from previous methods. First, using an efficient sequential testing algorithm, test sequences are generated for a large number of possible faults in the given sequential circuit. A minimal subset of memory elements is then found, which if made observable and controllable will result in easy detection of the sequentially redundant and irredundant but difficult-to-defect faults. The deterministic test generation algorithm is again used to generate tests for these faults in the modified circuit (the circuit with the identified memory elements made scannable). Detection of all irredundant faults can be guaranteed as in the complete scan design case, but at significantly less area and performance cost

Published in:

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Date of Conference:

12-14 Sep 1988