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An expert test program generation system for per-pin testers

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4 Author(s)
Walter, A. ; IBM, Hopewell Junction, NY, USA ; Kleinman, Y. ; Edelshteyn, L. ; Gartner, J.

The development is discussed of a rules-based automatic test-program generator (ATPG) that integrates IBM's CAD (computer-aided design) system with a per-pin tester. The authors describe the versatility of the ATPG that gleans test patterns and the logic model from the CAD system, merges produce technology characteristics and generates a complete test program that verifies the electrical, functional, and timing integrity of the device under test

Published in:

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Date of Conference:

12-14 Sep 1988

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