An expert test program generation system for per-pin testers

The development is discussed of a rules-based automatic test-program generator (ATPG) that integrates IBM's CAD (computer-aided design) system with a per-pin tester. The authors describe the versatility of the ATPG that gleans test patterns and the logic model from the CAD system, merges produce technology characteristics and generates a complete test program that verifies the electrical, functional, and timing integrity of the device under test.<
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