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Built-in test compiler in an ASIC environment

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2 Author(s)
Archambeau, E. ; VLSI Technol. Inc., San Jose, CA, USA ; Van Egmond, K.

A built-in test (BIT) block compiler integrated into a set of design tools is described. One module of the BIT compiler generates both a structural description and a behavioral simulation model for pseudorandom pattern generators and signature analyzers, based on a linear feedback shift register technique. The details of this module and a technique for merging the built-in test into a complete ASIC test program are shown

Published in:

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Date of Conference:

12-14 Sep 1988

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