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Contactors for testing at high frequencies

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1 Author(s)
Riechelmann, B. ; SYM-TEK Syst. Inc., San Diego, CA, USA

A review is presented of the contactor in testing of high-speed ICs. The contactor, which establishes temporary connections to the leads of the device under test (DUT), must not impair the electrical performance of the DUT. In addition, it must have mechanical and thermal characteristics suitable for automatic environmental handling. The author concludes that although the ideal or perfect test contactor does not yet exist, contactor design is keeping pace with advances in the integrated-circuit industry

Published in:

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Date of Conference:

12-14 Sep 1988

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