A new digital distortion calibration technique is demonstrated in a 14-bit 20-MS/s pipelined analog-to-digital converter (ADC). Calibration parameters are obtained in a way similar to conventional digital gain calibration. The prototype ADC has been fabricated in a 0.18-mum CMOS process and consumes 33.7 mW at 2.8 V. Using the proposed calibration method, a 15-dB improvement of the third-order harmonic rejection is achieved. The measured SNDR and SFDR are 71.6 and 82.3 dB, respectively
Published in:
Solid-State Circuits, IEEE Journal of
(Volume:41
,
Issue:
11
)
Date of Publication: Nov. 2006