By Topic

Improved n -Detection Test Sequences Under Transparent Scan

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
I. Pomeranz ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN ; S. D. Reddy

The quality of test sequences for scan circuits under a test-application scheme called transparent scan as n-detection test sequences is studied. A transparent-scan sequence T is obtained from a compact single-detection combinational test set C. It is shown that for the same number of clock cycles required to apply C, the transparent-scan sequence T detects faults more times than C. It is also noted that a transparent-scan sequence based on a combinational test set contains unspecified values. The effects of specifying the unspecified values of the transparent-scan sequence on the quality of the sequence are studied by considering a random specification of these values. A procedure for modifying the scan-select subsequence of a (fully specified) transparent-scan sequence so as to improve its quality as an n-detection test sequence is also described. Finally, the extension of a transparent-scan test sequence into an n-detection test sequence that detects every target fault at least n times is considered. The results show a slower increase in test-application time with n than when combinational test sets are considered

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:25 ,  Issue: 11 )