Cart (Loading....) | Create Account
Close category search window

An Integrated High-Level On-Line Test Synthesis Tool

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Oikonomakos, P. ; Sch. of Electron. & Comput. Sci., Southampton Univ. ; Zwolinski, M.

Several researchers have recently implemented on-line testability in the form of duplication-based self-checking digital system design, early in the design process. The authors consider the on-line testability within the optimization phase of iterative, cost function-driven high-level synthesis, such that self-checking resources are inserted automatically without any modification of the source behavioral hardware description language code. This is enabled by introducing a metric for the on-line testability. A new variation of duplication (namely inversion testing) is also proposed and used, providing the system with an additional degree of freedom for minimizing hardware overheads associated with test resource insertion. Considering the on-line testability within the synthesis process facilitates fast and painless design space exploration, resulting in a versatile high-level-synthesis process, capable of producing alternative realizations according to the designer's directions, for alternative target technologies. Finally, the fault escape probability of the overall scheme is discussed theoretically and evaluated experimentally

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:25 ,  Issue: 11 )

Date of Publication:

Nov. 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.