Referenced Items are not available for this document.
A highly accelerated life-test (HALT) method was employed to life test nearly 20 vendor lots of 50-V rated COG, X7R, and Z5U chip capacitors at 400 V and 140 degrees C stress. Their failure rates were compared with those observed in the standard 1000-h life test at 100 V and 125 degrees C stress. Acceptable correlation was observed between the two methods. In addition to reducing the qualification time from months to a few days, HALT has the capability of ascribing the device failures to manufacturing-process or material defects. It can greatly help users to identify defective lots quickly, determine the mean-time-to-failure of each incoming, lot, and detect major changes in the vendor's processes.<
Published in:
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
(Volume:11
,
Issue:
4
)
Date of Publication: Dec. 1988
- Page(s):
- 342 - 345
- ISSN :
- 0148-6411
- INSPEC Accession Number:
- 3332521
- Digital Object Identifier :
- 10.1109/33.16665
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Dec. 1988
- Sponsored by :
- IEEE Components, Packaging, and Manufacturing Technology Society
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