Cart (Loading....) | Create Account
Close category search window
 

Hot spot effects in hybrid circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rottiers, L. ; Lab. of Electron., Ghent State Univ., Belgium ; De Mey, G.

The temperature field due to a hot spot is investigated using a two-dimensional, an improved two-dimensional, and a three-dimensional analysis. It is shown that if the dimensions of the heat source are less than a critical distance, a two-dimensional approach fails even for substrates with a high-thermal conductivity. A combined model involving a local zooming is proposed.<>

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:11 ,  Issue: 3 )

Date of Publication:

Sept. 1988

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.