By Topic

The Air Force Electronic Combat Test Process

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Deis, M.R. ; Air Force Electron. Combat Office, Wright-Patterson AFB, Dayton, OH, USA

The Air Force Electronic Combat Office was tasked by the Chief of Staff, Air Force (AF), to implement a disciplined test process for development and modification of electronic combat systems. This tasking has resulted in the development and implementation of the AF Electronic Combat (EC) Test Process. The author answers four questions: why is there a need for an AF EC Test Process; how does this process relate to the acquisition development process; what is the AF EC Test Process; and where does this development lead to. These questions are answered by providing: background information on the need for improving the way one acquires and tests EC systems; information on the relationship of the AF EC Test Process to Department of Defense policy, procedures, and guidelines; and a description of the AF EC Test Process

Published in:

Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National

Date of Conference:

20-24 May 1991