Cart (Loading....) | Create Account
Close category search window
 

Perceptual impact of edge sharpness in images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Lin, W.S. ; Inst. for Infocomm Res., Singapore, Singapore ; Gai, Y.L. ; Kassim, A.A.

A method based upon subjective viewing tests to evaluate the perceptual impact of different extents of edge sharpness is presented and the most eye-pleasing sharpness (MEPS) for an image edge-sharpening process is derived. The findings with Laplacian of Gaussian edge-enhancement filter show that the baseline MEPS is about 2.6 times that of the local just-noticeable difference, and the actual MEPS is also dependent on the contrast increase in the surrounding areas. The proposed methodology can be used to determine the MEPS for a particular edge-enhancement process, and the resultant formulation for the perceptual impact of edge sharpness can be used for reference in control of edge enhancement, image reconstruction and de-blurring processing, as well as objective visual quality gauge.

Published in:

Vision, Image and Signal Processing, IEE Proceedings -  (Volume:153 ,  Issue: 2 )

Date of Publication:

6 April 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.