By Topic

Conference highlights

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

The following topics are dealt with: high-k metal gate stacks; integrated circuits and manufacturing; advanced interconnect technology; displays, sensors, and MEMS; organic and flexible electronics; CMOS devices; solid-state and nanoelectronic devices; nonvolatile memory technologies; MONOS and nanocrystal memories; CMOS and interconnect reliability; modeling and simulation; nanotubes and nanowires; DRAM and NAND Flash; quantum, power and compound semiconductor devices; RF power and power switching devices; gate dielectric breakdown; strained silicon technology; advanced planar CMOS devices; fully silicided gates; SRAM; bias-temperature instability and interface traps; advanced FEOL technology; SOI and multi-gate devices; resistive switching memories; image sensors and photon detectors; thin film transistors for displays and system on panel; and III-V light emitters

Published in:

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.

Date of Conference:

5-5 Dec. 2005