Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Resonance light scattering (RLS) detection of nanoparticle separations in a microelectrical field-flow fractionation system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Graff, M. ; Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., USA ; Bruno Frazier, A.

In this study, resonance light scattering (RLS) is demonstrated as a detection methodology for real-time visualization of the electrical field-flow fractionation process. On-column RLS was used to monitor the fractionation of a bolus sample containing 40-, 60-, and 80-nm-diameter RLS Particles into individual particles and bands of particles. Optical detection using the RLS system was correlated to an on-chip electrical conductivity detector. Particle concentrations as low as 1.08×10-12 M (1 RLS Particle/1.54 pL) were detected using both the optical and electrical detection systems.

Published in:

Nanotechnology, IEEE Transactions on  (Volume:5 ,  Issue: 1 )