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The influence of extra carrier noise on vertical-cavity surface-emitting lasers

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7 Author(s)
Danckaert, J. ; Dept. of Appl. Phys. & Photonics, Vrije Univ., Brussels, Belgium ; Soriano, M.C. ; Van der Sande, G. ; Peeters, M.
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This paper presents a systematic study of the effect of an extra current noise source added to the low-noise current injection source of a thermally stabilized vertical-cavity surface-emitting laser (VCSEL). An analytical study of a set of simple rate equations for a typical semiconductor laser is also carried out. On that basis, carrier noise is considered to be responsible for a change in the nonlinear gain saturation due to spatial effects.

Published in:
Quantum Electronics Conference, 2005. EQEC '05. European

Date of Conference: 12-17 June 2005

Print ISBN:
0-7803-8973-5
INSPEC Accession Number:
8946177
Digital Object Identifier :
10.1109/EQEC.2005.1567194
Product Type:
Conference Publications

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