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Effectiveness of previous SRAM leakage reduction techniques vary significantly as the leakage variation gets worse with process and temperature fluctuation. This paper proposes a simple circuit technique that adaptively trades off overhead energy for maximum leakage savings under severe leakage variations. The proposed run-time leakage reduction technique for on-die SRAM caches considers architectural access behavior to determine how often the SRAM blocks should enter a sleep mode. A self-decay circuit generates a periodic sleep pulse with an adaptive pulse period, which puts the SRAM array into a sleep mode more frequently at high leakage conditions (fast process, high temperature) and vice versa. An 0.18-μm 1.8-V 16-kbyte SRAM testchip shows 94.2% reduction in SRAM cell leakage at a performance penalty less than 2%. Measurement results also indicate that our proposed memory cell improves SRAM static noise margin by 25%.