By Topic

Radiation hardness evaluation of a class V 32-bit floating-point digital signal processor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
R. Joshi ; Texas Instruments Inc., Dallas, TX, USA ; R. Daniels ; M. Shoga ; M. Gauthier

The single event effects (SEE) and total ionizing dose (TID) test results of SMV320C6701, a 32-bit, floating-point digital signal processor (DSP) from Texas Instruments (TI) are reported in this paper. The DSP was tested for SEE using heavy ions and high energy neutrons. Effects characterized include single event upsets (SEU) and single event latch-up (SEL). Additional effects such as functional interrupts and transients are also discussed. Finally, the proton SEU rates extrapolated from the heavy ion SEU rates are presented.

Published in:

IEEE Radiation Effects Data Workshop, 2005.

Date of Conference:

11-15 July 2005