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Part II. Dynamic single event upset characterization of the Virtex-II field programmable gate array using proton irradiation

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2 Author(s)
D. M. Hiemstra ; MDA Corp., Brampton, Ont., Canada ; F. Chayab

The proton induced dynamic SEU cross-section of additional functional blocks and reference designs on the Virtex-II FPGA are presented. The measured reference design cross-sections are compared with calculated cross-sections based on their functional block utilization. The reference designs upset cross-sections are used to estimate their upset rate in the space radiation environment.

Published in:

IEEE Radiation Effects Data Workshop, 2005.

Date of Conference:

11-15 July 2005