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Accurate modeling of noise in switched-C ΔΣ analog-to-digital converters

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2 Author(s)
E. Hegazi ; Integrated Circuits Lab., Ain Shams Univ., Cairo, Egypt ; N. Klemmer

An accurate physical model of switched-capacitor ΔΣ analog-to-digital converters (ADCs) noise is presented. Noise artifacts for various ADC blocks are captured using simple equations. Model is verified against measured 0.25-μm high dynamic range ADC test chip for a wireless receiver. Design guidelines based on the proposed model are discussed.

Published in:

IEEE Transactions on Circuits and Systems I: Regular Papers  (Volume:52 ,  Issue: 11 )