Cart (Loading....) | Create Account
Close category search window
 

Fault analysis on distribution feeders with distributed generators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Baran, M.E. ; Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA ; El-Markaby, I.

This paper shows that the current an inverter interfaced distributed generator (IIDG) contributes to a fault varies considerably, due mainly to fast response of its controller. This paper proposes a method to extend the conventional fault analysis methods so that IIDG contribution can be estimated in the fault analysis. The proposed method gives rms profiles of the fault currents of interest (IIDG contribution and the fault currents the protective device will see). Test results, based on a prototype feeder, show that the proposed approach can estimate the fault current's contributions under both balanced and unbalanced fault conditions.

Published in:

Power Systems, IEEE Transactions on  (Volume:20 ,  Issue: 4 )

Date of Publication:

Nov. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.