By Topic

Design of a fully HBT 40GS/s sampling circuit for very large bandwidth non repetitive signal analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
El Aabbaoui, H. ; Lille Univ., Villeneuve d''Ascq, France ; Rolland, N. ; Benlarbi-Delai, A. ; Fel, N.
more authors

The design of a fully heterojunction bipolar transistor (HBT) circuit allowing 20GHz bandwidth random signal sampling and the experimental results of the basic circuits are discussed. Assuming a temporal analysis depth of 5ns, this circuit, based on the principle of non simultaneous spatial sampling can reach, in a single shot mode, a truly sampling frequency of 40GS/s. Its realization, led through several InP HBT MMIC (FT=180GHz) and CPW propagation line permits to meet the main requirements in terms of bandwidth, dynamic range and jitter.

Published in:

Microwave Symposium Digest, 2005 IEEE MTT-S International

Date of Conference:

12-17 June 2005