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A new multiport measurement-method using a two-port network analyzer

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2 Author(s)
Lenk, F. ; Ferdinand-Braun-Inst. fur Hochstfrequenztech., Berlin, Germany ; Doerner, R.

A new method is presented how to characterize multiport devices using a two-port vector network-analyzer (VNA). Up to now, at least one of the port terminations had to be fully known to measure the S-parameters of the device. Our new measurement method overcomes this restriction. All of the device parameters and all of the port terminations are calculated from the device measurements.

Published in:

Microwave Symposium Digest, 2005 IEEE MTT-S International

Date of Conference:

12-17 June 2005