By Topic

Effect of DC voltage on dielectric properties of low-voltage cable with XLPE insulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xiaohong Zhang ; Inst. of Electr. & Electron. Eng., Harbin Univ. of Sci. & Technol., China ; Qingjuan Hu ; Junguo Gao ; Yong Liu

The microstructures of a XLPE cable sample in service for one year (sample-A) and a fresh XLPE cable sample (sample-B), which were applied high electrical stress in order to initiate electrical tree, were observed by means of scan electronic microscope (SEM) and optic microscopy. It is found that the electrical trees in sample-A are longer in length and more in dimensionality than those of sample-B. Some special traces appear in SEM image of sample-A, which are thought to be additive crystallite separating from polymer under high electrical stress. Dielectric loss tangent (tanδ) of sample-A at 110i is higher 30% than that of sample-B. However phenomenon of insulation resistance of sample-A falling did not be observed in the test, which is different from the monitoring results of sample-A in service.

Published in:

Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on  (Volume:3 )

Date of Conference:

5-9 June 2005