Cart (Loading....) | Create Account
Close category search window
 

Effects of modified modulation strategies on bearing currents and operational characteristics of AC induction machines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Zitzelsberger, J. ; Dept. of Electr. Machines & Drives, Chemnitz Univ. of Technol., Germany ; Hofmann, W.

Newest investigations have shown that bearing currents can be lowered by using modified pulse pattern generation methods. One suggestion for such a solution is the principle of sequentially positioned pulses. Hereby, a modified space vector modulation is used, in order to reduce both the amplitude of and the number of potential alterations in the common mode voltage. This voltage is the reason for EDM and dv/dt currents which are mostly responsible for severe bearing damages in modem inverter fed drive applications. The paper will show the fundamental basics concerning this principle and its characteristic influences on the operational behaviour of an inverter fed AC induction machine.

Published in:

Industrial Electronics Society, 2004. IECON 2004. 30th Annual Conference of IEEE  (Volume:3 )

Date of Conference:

2-6 Nov. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.