IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Electromagnetic Compatibility ... Help

Finite element method for the accurate analysis of delay line propagation characteristics

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Topsakal, E. ; Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA ; Volakis, J.

The finite element method (FEM) with tetrahedral elements has been applied to a meander delay line problem for determining propagation characteristics. S11 at the input port and the field variation right above the delay line are calculated and compared with reference data. The effects of meander line spacing and meander line length on the output voltage are also investigated. Results are obtained for various dielectric substrates having different thicknesses.

Published in:
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on  (Volume:2 )

Date of Conference: 11-16 May 2003

Page(s):
1074 - 1076 Vol.2
Print ISBN:
0-7803-7779-6
INSPEC Accession Number:
8338023
Digital Object Identifier :
10.1109/ICSMC2.2003.1429101
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.