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Built-in self test (BIST) scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. The scheme tests for crosstalk faults with a periodic square wave test signal under applied random patterns generated by a linear feedback shift register (LFSR), which is transconfigured from the embedded circuit's boundary scan cells. The scheme simplifies test generation and test application while obviating the fault occurrence timing issue. Experimental results show that coverage for the induced-glitch type of crosstalk fault for large benchmark circuits can easily exceed 90%.