Cart (Loading....) | Create Account
Close category search window
 

Test methodologies in the deep submicron era - analog, mixed-signal and RF

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Chatterjee, A. ; Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA ; Keshavarzi, A. ; Patra, A. ; Mukhopadhyay, S.

Summary form only given. The goal of this tutorial is to give the audience a detailed overview of testing challenges, proposed solutions and open problems. The tutorial starts with the introduction to testing challenges in the deep sub micron era. Issues with process variations and leakage and their impact on testing are discussed. This is followed by issues regarding fault modeling, DFT and BIST of analog and mixed signal circuits. It is shown how behavioral modeling could be utilized for such circuits in, conceptually, the same way that stuck-at fault modeling is used for digital testing. Issues and conceptual details regarding on-line testing are introduced, both in the contexts of digital as well as mixed signal circuits. The last part of the tutorial introduces in detail concept of built-in test (BIT) and built-off self-test (BOST) for high frequency RF circuits. A new paradigm for BIST of high-speed/RF circuits using alternate tests is also introduced.

Published in:

VLSI Design, 2005. 18th International Conference on

Date of Conference:

3-7 Jan. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.