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Crosstalk induced fault analysis in DRAMs

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2 Author(s)
Zemo Yang ; Santa Clara Univ., CA, USA ; Mourad, S.

In this paper we focus on the analysis of crosstalk among the bit-lines during the read operation, especially when defect and parameter variations exist. We identify such faults as crosstalk reading (CTR) faults. An analytical study of these faults was done and we supported the study with extensive simulation results.

Published in:

SOC Conference, 2004. Proceedings. IEEE International

Date of Conference:

12-15 Sept. 2004