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De-embedding procedure based on computed/measured data set for pcb structures characterization

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3 Author(s)
G. Antonini ; Dept. of Electr. Eng., Univ. of L'Aquila, Italy ; A. C. Scogna ; A. Orlandi

This paper uses a de-embedding procedure, based on measured and numerically computed S-parameters, to obtain the characterization of portions of a structure difficult to obtain by direct measurements. The results are validated by measurements and independent calculations.

Published in:

IEEE Transactions on Advanced Packaging  (Volume:27 ,  Issue: 4 )