Cart (Loading....) | Create Account
Close category search window
 

The HADES tracking system: first in-beam experiences with operation and aging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

14 Author(s)
Kanaki, K. ; Inst. fur Kern- und Hadronenphysik, Forschungszentrum Rossendorf, Dresden, Germany ; Dohrmann, F. ; Enghardt, W. ; Garabatos, C.
more authors

The High Acceptance Di-Electron Spectrometer (HADES) at the heavy ion synchrotron SIS of GSI, Darmstadt, is a high-resolution second generation detector system for lepton pair spectroscopy. Its low-mass tracking system consists of two pairs of planes of trapezoidally shaped Multiwire Drift Chambers (MDC), installed on either side of a superconducting toroidal magnet. This paper summarizes some experiences with the construction and the in-beam operation of the six large-area chambers produced by Forschungszentrum Rossendorf. Studies on creeping of aluminum wires over a period of three years are presented. In addition, the observation of growth of filaments with various shapes and sizes in one of the chambers used in-beam will be discussed in detail.

Published in:

Nuclear Science Symposium Conference Record, 2003 IEEE  (Volume:5 )

Date of Conference:

19-25 Oct. 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.