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A built-in technique for probing power-supply noise distribution within large-scale digital integrated circuits

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3 Author(s)
Okumoto, T. ; Dept. of Comput. & Syst. Eng., Kobe Univ., Japan ; Makoto Nagata, ; Taki, K.

Noise detector circuits as compact as standard logic cells for being embedded within a high-density large-scale digital circuit enable in-depth characterization of dynamic power-supply and ground noises. Voltage drops at the locations of active cell rows within 1.8-V standard cell based digital circuits are consistently measured by 1.8-V and 2.5-V built-in detectors in a 0.18-μm CMOS triple well technology. Measurements show that the ground-noise distribution is distinctively more localized than the power-supply counterpart due to the presence of a substrate.

Published in:

VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on

Date of Conference:

17-19 June 2004