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Dynamic power-supply and well noise measurement and analysis for high frequency body-biased circuits

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5 Author(s)
K. Shimazaki ; Matsushita Electr. Ind. Co. Ltd., Kyoto, Japan ; M. Nagata ; T. Okumoto ; S. Hirano
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Dynamic noises on power-supply as well as multiple wells necessary for body-biased circuits show frequency components strongly characterized by the interaction of circuit operation and AC transfer of biasing networks. Measurements with the resolution of 100-ps and 100-uV for a few 100-ns and 1-V ranges on multiple points in a product register file are performed at various operating frequencies up to 400 MHz and show the noises clearly emphasized in frequency domain by the interaction. A proposed analysis flow recruiting a fast SPICE simulator and parasitic extractors can predict the dynamic noises due to combined power supply, ground, well, and substrate interactions, and provide robustness to the design of body-bias control circuitry.

Published in:

VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on

Date of Conference:

17-19 June 2004