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Flexible embedded test solution for high-speed analogue front-end architectures

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3 Author(s)
A. Lechner ; Center for Microsystems Eng.-FAS, Lancaster Univ., UK ; M. J. Burbidge ; A. M. D. Richardson

A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.

Published in:

IEE Proceedings - Circuits, Devices and Systems  (Volume:151 ,  Issue: 4 )