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Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators

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2 Author(s)
Leger, G. ; Inst. de Microelectron. de Sevilla, Univ. de Sevilla, Spain ; Rueda, A.

A digital technique for evaluating the integrator leakage within first- and second-order ΣΔ modulators is proposed. It involves a very small amount of hardware, which makes it specially suitable for built-in self-test (BIST) implementation. Integrator leakage is known to be related to the converter precision and, hence, the proposed test technique serves as an indirect test of the signal-to-noise ratio (SNR) degradation. As an additional result, a strategy has been derived for digitally correcting the SNR loss due to integrator leakage in cascaded modulators.

Published in:

Circuits, Devices and Systems, IEE Proceedings -  (Volume:151 ,  Issue: 4 )

Date of Publication:

12 Aug. 2004

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