Referenced Items are not available for this document.
A digital technique for evaluating the integrator leakage within first- and second-order ΣΔ modulators is proposed. It involves a very small amount of hardware, which makes it specially suitable for built-in self-test (BIST) implementation. Integrator leakage is known to be related to the converter precision and, hence, the proposed test technique serves as an indirect test of the signal-to-noise ratio (SNR) degradation. As an additional result, a strategy has been derived for digitally correcting the SNR loss due to integrator leakage in cascaded modulators.
Published in:
Circuits, Devices and Systems, IEE Proceedings -
(Volume:151
,
Issue:
4
)
Date of Publication: 12 Aug. 2004
- Page(s):
- 349 - 358
- ISSN :
- 1350-2409
- INSPEC Accession Number:
- 8222941
- Digital Object Identifier :
- 10.1049/ip-cds:20040558(410) 151
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 04 October 2004
- Issue Date :
- 12 Aug. 2004
- Sponsored by :
- IET
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