Cart (Loading....) | Create Account
Close category search window
 

Leaky delayed LMS algorithm: stochastic analysis for Gaussian data and delay modeling error

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tobias, Orlando J. ; Dept. of Electr. Eng., Fed. Univ. of Santa Catarina, Brazil ; Seara, R.

This paper presents a stochastic analysis of the delayed least-mean-square (DLMS) adaptive algorithm with leakage. This analysis is obtained taking into account that mismatches between the system delay and its estimate may occur. Such an approach is not considered in previous models. In addition, it is shown that the introduction of a leakage factor into the adaptive algorithm keeps the adaptive algorithm stable under an imperfect delay estimate condition. Recursive difference equations for the first and second moments of the adaptive filter weights are derived. An expression for the critical value of the step size is also determined. Results of Monte Carlo simulations present excellent agreement with the proposed model for both white and colored Gaussian inputs.

Published in:

Signal Processing, IEEE Transactions on  (Volume:52 ,  Issue: 6 )

Date of Publication:

June 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.