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Fabrication and program/erase characteristics of 30-nm SONOS nonvolatile memory devices

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8 Author(s)
Suk-Kang Sung ; Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., South Korea ; Il-Han Park ; Chang Ju Lee ; Yong Kyu Lee
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In this paper, we have fabricated nanoscale silicon-oxide-nitride-oxide-silicon (SONOS) nonvolatile memory devices by means of the sidewall patterning technique. The fabricated SONOS devices have a 30-nm-long and 30-nm-wide channel with 2.3/12/4.5-nm-thick oxide/nitride/oxide film on fully depleted-silicon-on-insulator (FD-SOI) substrate. The short channel effect is well suppressed though devices have very short channel length and width. Also, the fabricated SONOS devices guarantee good retention and endurance characteristics. In 30-nm SONOS devices, channel hot electron injection program mechanism is inefficient and 2-b operation based on localized carrier trapping in the nitride film is difficult. The erase speed is improved by means of band-to-band (BTB) assisted hole injection mechanism. In 30-nm SONOS devices, program and erase operation can be performed efficiently with improved erase speed by combination of Fowler-Nordheim (F-N) tunneling program and BTB assisted hole injection erase mechanism because the entire channel region programmed by F-N tunneling can be covered by two-sided hole injection from source and drain.

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IEEE Transactions on Nanotechnology  (Volume:2 ,  Issue: 4 )