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A testable realization of Generalized Reed-Muller (GRM) or EXOR Sum-of-Products (ESOP) expression has been proposed that admits a combined universal test set of size (2n+6) for detection of stuck-at and bridging faults. For GRM implementation, the test set detects all single stuck-at and bridging faults (both OR and AND type) and a large number of multiple bridging faults. For ESOP, a few single bridging faults may remain untested, occurrence of which can be avoided by employing a design and layout technique. The test set is independent of the function and the circuit-under-test and can be stored in a ROM on chip for built-in self-test. For several benchmark circuits, the size of the test set is found to be much smaller than an ATPG-generated test set or those of the previous methods.