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Improvement of detectability for CMOS floating gate defects in supply current test

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5 Author(s)
H. Michinishi ; Fac. of Eng., Okayama Univ. of Sci., Japan ; T. Yokohira ; T. Okamoto ; T. Kobayashi
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We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.

Published in:

Test Symposium, 2003. ATS 2003. 12th Asian

Date of Conference:

16-19 Nov. 2003