Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Self-calibration of ultrasonic transducers in an intelligent data acquisition system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Papageorgiou, C. ; Electron. Lab. Phys. Dept., Aristotle Univ. of Thessaloniki ; Laopoulos, T.

The rapid growth of powerful single-chip microcomputers for monitoring and data acquisition applications permits nowadays the design of advanced measuring systems. We present an advanced on-line monitoring configuration in order to improve the performance and extend the lifetime of ultrasonic transducers by applying an automated testing and calibration technique. The operation of this instrumentation system is based on the fast measurement of frequency and amplitude, performed by the proposed configuration. The combination of this information with the time of flight of each pulse-train is then used to derive practically all characteristics of ultrasonic transducers. Due to its low cost and small size, the system can be used either for characterization and classification of transducers, or as a self-testing and automated calibration section within any high performance ultrasonic system

Published in:

Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2003. Proceedings of the Second IEEE International Workshop on

Date of Conference:

8-10 Sept. 2003