**3**Author(s)

#
On ϵ-biased generators in NC^{0}

- Already Purchased? View Article
- Subscription Options Learn More

By Topic

- Aerospace
- Bioengineering
- Communication, Networking & Broadcasting
- Components, Circuits, Devices & Systems
- Computing & Processing (Hardware/Software)
- Engineered Materials, Dielectrics & Plasmas

M. Cryan and P.B. Miltersen (2001) recently considered the question of whether there can be a pseudorandom generator in NC^{0}, that is, a pseudorandom generator that maps n bits strings to m bits strings and such that every bit of the output depends on a constant number k of bits of the seed. They show that for k = 3, if m ≥ 4n + 1, there is a distinguisher; in fact, they show that in this case it is possible to break the generator with a linear test, that is, there is a subset of bits of the output whose XOR has a noticeable bias. They leave the question open for k ≥ 4. In fact they ask whether every NC^{0} generator can be broken by a statistical test that simply XORs some bits of the input. Equivalently, is it the case that no NC^{0} generator can sample an ε-biased space with negligible ε? We give a generator for k = 5 that maps n bits into cn bits, so that every bit of the output depends on 5 bits of the seed, and the XOR of every subset of the bits of the output has bias 2^{-Ω(n}c4)/. For large values of k, we construct generators that map n bits to n^{Ω(√k)} bits and such that every XOR of outputs has bias 2^{-n1}(2√k)/. We also present a polynomial-time distinguisher for k = 4, m ≥ 24n having constant distinguishing probability. For large values of k we show that a linear distinguisher with a constant distinguishing probability exists once m ≥ Ω(2^{k}n^{[k}2]/). Finally, we consider a variant of the problem where each of the output bits is a degree k polynomial in the inputs. We show there exists a degree k = 2 pseudorandom generator for which the XOR of every subset of the outputs has bias 2^{-Ω(n)} and which map n bits to Ω(n^{2}) bits.

- Page(s):
- 136 - 145
- ISSN :
- 0272-5428
- Print ISBN:
- 0-7695-2040-5
- INSPEC Accession Number:
- 7847045

- DOI:
- 10.1109/SFCS.2003.1238188
- Publisher:
- IEEE