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Browse Conference Publications > Multimedia and Expo, 2001. IC ... Help

Comparing salient point detectors

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2 Author(s)
Sebe, N. ; Leiden Institute of Advanced Computer Science ; Lew, M.S.

First Page of the Article

Published in:
Multimedia and Expo, 2001. ICME 2001. IEEE International Conference on

Date of Conference: 22-25 Aug. 2001

Page(s):
64 - 67
Print ISBN:
0-7695-1198-8
Conference Location :
Tokyo, Japan
Digital Object Identifier :
10.1109/ICME.2001.1237656
Product Type:
Conference Publications

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